Register

Create your own FREE account with surfacequery.com and we will contact you with more details about a subscription or a one-off search.

More details…

Search

Here you can perform a record search by entering keywords.

You can use the special keywords AND, OR and NOT in between words to refine your search.

This search also supports the wildcard character * and the use of quotes.

Subscription or one-off search

With a subscription or a one-off seach, the "author", "journal", "source", "date", "volume" and "page" details are presented along with the "abstract titles" and "anstracts".

More details…

179 results. per page « 1 2 3 4 5 6 7 8 9 10 11 12 »

XI. raised deposit, another unleveled problem.

Relevancy:  

 

Xiangshan Science Conference on Supramolecular Systems, Beijing, China, October 16-21, 1998

Relevancy:  

.

XII. Factors affecting the burning of deposits.

Relevancy:  

 

XIII. Adhesion of deposits-part one.

Relevancy:  

 

XIII. Adhesion of deposits-part two.

Relevancy:  

 

XIV. Internal stress and brittleness of deposits.

Relevancy:  

 

XIX. Production safety and cleaner production in electroplating-Part II.

Relevancy:  

 

XMA and ESCA measurement of anodized film on Al-Mn alloy plate

Relevancy:  

XMA and ESCA measurement was carried out for anodized films on Al-Mn alloy plates (99.99% Al + 1% Mn). XMA plane analysis showed that Mn was dispersed like islands of diam. of a few µm. ESCA spectra indicated that Mn peak shifted 2.6 eV in plus direction. It is possible that Mn is in oxidized state (Mn(III)).

XPS & SEM Studies of Bright Metal Electrodeposits from DC & Pulse Plating

Relevancy:  

Title methods were used to study bright Ni (Watts), sulphamate Ni, bright Cu & bright Zn deposits. Bath comp'ns are given in full, all used thiocyanate. Diagrams show the effect of pulsing on the diffusion layer thickness & shape. Reports of deposit structures & current efficiencies are given. Effects of pulsing on structure & effects of thiocyanate are shown. Data on deposit porosities are given and histogram shows nucleus size distributions. Data from transient current-time plots is shown.XPS analyses (incl. for sulphur & nitrogen) in deposits are listed. Some results for Ni electrodep'n onto LIGA oxide substrates are given. Comments on incorporation of brighteners into the deposits. 5 refs

XPS - a tool for chemical characterisation of coatings & interfaces

Relevancy:  

Sets out reasons why surface analysis is necessary, and explains basics of XPS (photoelectriic spectroscopy) with sketch & photo of an instrument. Typical operation consists of initial survey spectrum (example is oxygenated fluoropolymer) followed by narrow scans to determine individual elements and the state they are in. Etching and measurement sequences allow depth-profiling. Case studies incl. low-emissivity glass, painted surfaces incl. defects such as flaking, craters, delamination or mottling. Sequence of coloured images show crater analysis...

XPS and AES analyses of cerium conversion coatings generated on AA5083 by thermal activation.

Relevancy:  

SURF Reports analysis of cerium conversion coatings developed with thermal activation on AA5083 under optimum processing conditions. Scanning electron microscopy (SEM), electron dispersive spectroscopy (EDX), X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) were employed to study these layers. Ar+ sputtering was also employed to analyse the coatings' core. Although conversion coatings based on Ce salts have been widely characterised in the literature for different aluminium alloys, the coatings developed with thermal activation on Al-Mg alloys have not been previously investigated with these techniques. SEM/EDX studies have demonstrated the existence of a heterogeneous layer formed by a film of aluminium oxide/hydroxide on the matrix as well as a series of dispersed islands of cerium deposited on the cathodic intermetallics. These results have been further confirmed by means of XPS. The XPS and AES results revealed that the outer layer comprises a mixture coating of Ce3 + (70%) and Ce4 + (30%) compounds. Although only Ce3 + compounds were detected at the inner part of the coating, possible reduction of Ce(IV) to Ce(III) due to the Ar+ beam could not be discarded. Obtained results allowed authors to confirm that the cerium conversion coatings developed have a similar structure to those previously reported for other aluminium alloys.

XPS and AFM study of chemical mechanical polishing of silicon nitride

Relevancy:  

Effect of CMP of Si3N4 films was investigated. Films with different deposition methods (PECVD and LPCVD) and 2 different silica- based slurries were studied. Surface chemical structure of as-deposited LPCVD film is slightly better than that of as-deposited PECVD film, and surface morphologies (RMS roughness ~0.3 nm for LPCVD film, and 1.9 mm for PECVD film) are different. After CMP, the LPCVD film was more dramatically oxidized, and surface became rougher for process conditions used. the PECVD film was less dramatically oxidized, sub-silicon nitride (SiNx) appeared on surface, and surface became smoother. Quality of as-deposited nitride film, as well as CMP process conditions, impact significantly on quality of polished surface.

XPS and Ion Scattering Studies on Compound Formation and Interfacial Mixing in Titanium nitride/Ti Nanolayers on Plasma Nitrided Tool Steel.

Relevancy:  

XPS and SEM studies of chromium oxide films chemically formed on stainless steel 316 L

Relevancy:  

MCP Structure and composition of Cr oxide films formed on stainless steel by immersion in Cr electrolyte were studied by SEM and XPS. Cr2O3 crystallites in range 30-150 nm are fully developed and cover whole surface. Chemical composition in depth and thickness of oxide layer were determined by XPS sputter profiles. Oxide film within framework of double layer consists of thin outer hydrated layer and inner layer of Cr2O3.

XPS and X-ray diffraction studies of aluminium-doped zinc oxide transparent conducting films

Relevancy:  

Al-doped ZnO transparent conducting films prepared by spray pyrolysis at different dopant concns were characterised and results compared with pure ZnO films. X-ray diffraction shows increase in lattice parameters (c and a) for Al-doped films while ratio remains same. Within XPS detection limit films are chemically identical to pure ZnO. However, difference in core-electron line shape of Zn 2p(3/2) photoelectron peaks is predicted. Asymmetry in Zn 2p(3/2) photoelectron peaks has been observed for aluminium-doped films. The asymmetry parameters evaluated from core- electron line-shape analysis yield value of order of 0.04 ñ 0.01, between those for pure ZnO and attributed to presence of excess Zn in films.